Efficient and accurate measurement of very sharp crystallographic textures: A new measurement strategy
Efficient and accurate measurement of very sharp crystallographic textures: A new measurement strategy
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DOI：
10.1016/j.actamat.2012.04.009
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发表时间：
2012-06-01
期刊：
影响因子：
9.4
通讯作者：
Gottstein, G.
中科院分区：
文献类型：
--
作者：
Bachmann, F.;Witte, M.;Gottstein, G.
介绍了一种新的测量策略，以最准确和有效地确定多晶材料的非常明显的晶体织构。它具有优化的自适应细化连续X射线极图测量。为了优化总的实验时间以及角分辨率，从而极图测量的准确性，必须解决极点半球上的旅行商问题。相应的算法被编码和实现为控制纹理测角仪的软件的一部分。该程序适用于极图测量的NiW合金具有非常尖锐的立方织构。结果和传统的测量策略相比。(c)2012 Acta Materialia Inc.由爱思唯尔有限公司出版。保留所有权利。
A new measurement strategy is introduced to determine very pronounced crystallographic textures of polycrystalline materials most accurately and efficiently. It features optimized adaptively refined successive X-ray pole figure measurements. To optimize both the total experimental time as well as the angular resolution, and thus the accuracy of pole figure measurements, traveling salesman problems on the hemisphere of poles have to be resolved. The corresponding algorithm is encoded and implemented as part of the software controlling the texture goniometer. The procedure was applied to pole figure measurements of a NiW alloy with extremely sharp Cube texture. The results are presented and compared to conventional measurement strategies. (c) 2012 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.