New Oblique Thin Wire Formalism in the FDTD Method With Multiwire Junctions
New Oblique Thin Wire Formalism in the FDTD Method With Multiwire Junctions
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DOI：
10.1109/tap.2011.2180304
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发表时间：
2012-03
影响因子：
5.7
通讯作者：
C. Guiffaut;Alain Reineix;B. Pecqueux
中科院分区：
文献类型：
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作者：
C. Guiffaut;Alain Reineix;B. Pecqueux
在FDTD方法中，提出了一种新的基于Holland方法的斜细线格式。这种新形式主义的主要成就是使我们能够正确地模拟几条斜导线之间的连接。为此，提出了一个重要的准则：必须在包含一条或几条导线的一部分的Yee单元的每个节点上保持网格中电流迹线的连续性。这种情况防止了导线电流响应上的无抑制寄生振荡。此外，我们的方法在其使用上提供了多功能性。首先，导线的末端可以自由地放置在Yee牢房中。其次，它在有损耗的介质中工作，最后，当导线倾斜或移位时，其灵敏度降至最低。关于最后这一点，线段的单元内电感的公式是考虑线段位置及其在YEE单元中的倾斜度。
A new oblique thin wire formalism based on Holland's approach is proposed in the FDTD method. The principal achievement of this new formalism is to enable us to model a junction correctly between several oblique wires. To this end, an important criterion is proposed: the continuity of the current traces in the grid must be maintained at each node of the Yee cell that contains a part of one or several wires. This condition prevents undamped parasite oscillations on the wire current responses. In addition, our approach offers versatility in its usage. First the extremities of the wire can be placed freely in a Yee cell. Second it operates in lossy medium and finally, the sensitivity of the wire is minimized when inclined or shifted. With regards to this last point, the in-cell inductance of a wire segment is formulated to take account of the segment position and its obliquity in the Yee cell.