Thermal Expansion Measurements Using the Strain Gauge Technique with Kelvin Double Bridge
Thermal Expansion Measurements Using the Strain Gauge Technique with Kelvin Double Bridge
复制标题
使用开尔文双桥应变仪技术进行热膨胀测量
DOI：
10.1143/jpsjs.80sa.sa098
复制
发表时间：
2011
期刊：
影响因子：
--
通讯作者：
Noriaki K.Sato
中科院分区：
文献类型：
--
作者：
Noriyuki Kabeya;Keiichiro Imura;Kazuhiko Deguchi;Noriaki K.Sato
众所周知，应变计技术对于压力下的热膨胀测量非常有用。然而，该方法有一个问题需要解决；该技术中通常采用的惠斯通电桥会受到引线电阻产生的寄生效应的影响。在这里，我们报告说，通过使用开尔文双电桥而不是惠斯通电桥，可以显着抑制这种效应。作为重费米子应用的一个例子，我们展示了 UGe2 和 ZrZn2 的热膨胀测量结果，这些结果在强相关电子物理领域引起了广泛关注。
The strain gauge technique is known to be very useful for thermal expansion measurements under pressure. However, there is a problem to be resolved in this method; Wheatstone bridge that is conventionally employed in this technique is subject to a spurious effect resulting from lead-wire resistances. Here we report that such the effect is remarkably suppressed by using Kelvin double bridge instead of Wheatstone bridge. As an example of this application to heavy fermions, we present results of thermal expansion measurements of UGe2and ZrZn2that have been attracting much attention in the field of strongly correlated electron physics.