Crossover in the photoionization processes of neon clusters with increasing EUV free-electron-laser intensity
Crossover in the photoionization processes of neon clusters with increasing EUV free-electron-laser intensity
复制标题
随着 EUV 自由电子激光强度的增加,氖簇光电离过程的交叉
DOI:
10.1103/physreva.88.043203
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发表时间:
2013-10
影响因子:
2.9
通讯作者:
Ri Ma, et al
中科院分区:
文献类型:
--
作者:
S. Yase;K. Nagaya;Y. Mizoguchi;M. Yao;H. Fukuzawa,;K. Motomura;A. Yamada;Ri Ma, et al
Electron emission spectra and total electron yields were measured for relatively large (about 5000 atoms) neon clusters that were irradiated by extreme ultraviolet pulses with 20.3 eV, corresponding to thetransition. The present electron emission spectra are remarkably different from those for Ar clusters undergoing sequential ionization [Bostedt , Phys. Rev. Lett. 100, 133401 (2008)PRLTAO0031-900710.1103/PhysRevLett.100.133401] and can be interpreted as a superposition of a low-energy exponential tail, dominant at a low free-electron-laser intensity, and an intermediate-energy Gaussian-like peak which grows with. Correspondingly, the total electron yield exhibits interestingdependence. Especially, a plateau appears in the intermediaterange. These results suggest a crossover in the ionization mechanism from thermal electron to two-photon photoelectron emission. An exciton-Mott transition is proposed for the formation of nanoplasma.