Fabrication of nanogap electrodes by field-emission-induced- electromigration
Fabrication of nanogap electrodes by field-emission-induced- electromigration
复制标题
场发射诱导电迁移制备纳米间隙电极
DOI:
10.1116/1.3039683
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发表时间:
2009
影响因子:
1.4
通讯作者:
J. Shirakashi
中科院分区:
文献类型:
--
作者:
Y. Tomoda;Keisuke Takahashi;M. Hanada;W. Kume;J. Shirakashi
The authors report a simple and easy technique for the fabrication of nanogaps with separations of less than 10nm. This technique is based on electromigration induced by field emission current. Here, the authors investigated the dependence of tunnel resistance on the shape of nanogap electrodes and initial gap separation. The initial nanogap electrodes having asymmetrical shape with the separation of 30–60nm were fabricated by electron-beam lithography and lift-off process. In the nanogaps with asymmetrical shape, the tunnel resistance was controlled by the magnitude of the preset current during field-emission-induced electromigration and decreased from the order of 100TΩto100kΩ with increasing the preset current from 1nAto150μA. This tendency was quite similar to that of nanogaps with symmetrical shape. Furthermore, the tunnel resistance after the electromigration was less dependent on the initial gap separation and was completely determined by the preset current. This suggests that it is possible to con...
DOI:
--
发表时间:
2007
期刊:
Jpn. J. Appl. Phys. 46
影响因子:
--
作者:
S. Kayashima;K. Takahashi;M. Motoyama and J. Shirakashi
通讯作者:
M. Motoyama and J. Shirakashi