Single particle characterization by time-of-flight mass spectrometry
Single particle characterization by time-of-flight mass spectrometry
复制标题
通过飞行时间质谱法表征单粒子
DOI：
10.1080/02786829508965311
复制
发表时间：
1995
影响因子：
5.2
通讯作者：
A. Swanson
中科院分区：
文献类型：
--
作者：
W. Reents;S. Downey;A. Emerson;A. Mujsce;A. Muller;D. Siconolfi;J. Sinclair;A. Swanson
我们已经建立了一个颗粒分析仪能够实时检测和表征单个颗粒。粒子分析是通过脉冲激光烧蚀粒子，然后对所得原子和分子离子进行飞行时间质谱分析来完成的。检测到的离子是粒子分子组成的特征。不同尺寸（0.02-10 μm）和成分（硫酸铵，二氧化硅，硝酸铷和硝酸铯）的颗粒已被检测和表征。即使是耐火材料，例如二氧化硅，也很容易检测到。
We have built a particle analyzer capable of real-time detection and characterization of individual particles. Particle analysis is accomplished by pulsed laser ablation of a particle followed by time-of-flight mass spectrometry of the resulting atomic and molecular ions. The detected ions are characteristic of a particle's molecular composition. Particles of different sizes (0.02–10 μm) and compositions (ammonium sulfate, silica, rubidium nitrate, and cesium nitrate) have been detected and characterized. Even refractory materials, e.g. silica, are easily detected.