Age-related changes in the surface morphology of the central sulcus
Age-related changes in the surface morphology of the central sulcus
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中央沟表面形态与年龄相关的变化
DOI：
10.1016/j.neuroimage.2011.06.041
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发表时间：
2011-09-15
期刊：
影响因子：
5.7
通讯作者：
He, Yong
中科院分区：
文献类型：
--
作者：
Li, Shuyu;Xia, Mingrui;He, Yong
我们利用基于沟的计算方法来研究中央沟（CS）的三维（3D）形态与年龄之间的关系。使用295名右利手健康受试者（年龄范围：18-94岁）的高分辨率磁共振图像手动勾画CS的前壁和后壁。采用表面重建和参数化方法来创建参与者表面位置的解剖对应关系。四个表面指标。包括平均沟长（SL）、表面积、分维（FD）和沟跨度，用于代表CS的3D形态。我们发现CS的所有壁的表面积、CS后壁的SL和右侧CS后壁的FD均出现显著的年龄相关性减少。在前壁和后壁之间的脑沟跨度中发现了与脑卒中相关的增加。这些表面指标（除FD）表现出的非对称性。具体而言，年龄相关的表面形态的变化进展更迅速，在后壁比在前壁。最后，仅在CS右前壁的FD中发现了性别差异。两者合计，我们的研究结果表明，年龄相关的变化，在CS的表面形态，因此提供见解的正常老化过程。(C)2011 Elsevier Inc. All rights reserved.
We utilized a sulcus-based computational approach to investigate the relationship between the three-dimensional (3D) morphology of the central sulcus (CS) and age. The anterior and posterior walls of the CS were manually outlined using high-resolution magnetic resonance images of 295 right-handed healthy participants (age range: 18-94 years). Surface reconstruction and parameterization methods were employed to create anatomical correspondence of surface locations across participants. Four surface metrics. including average sulcal length (SL), surface area, fractal dimension (FD) and sulcal span, were used to represent the 3D morphology of the CS. We found significant age-related decreases in the surface area for all walls of the CS, the SL for posterior walls of the CS and the FD for posterior wall of right CS. Age-related increases were found in the sulcal spans between the anterior and posterior walls. These surface metrics (except FD) exhibited leftward asymmetries. Specifically, age-related changes in surface morphology progressed more rapidly in the posterior than in the anterior walls. Finally, sex differences were found only in the FD of the right anterior wall of the CS. Taken together, our results show age-related changes in the surface morphology of the CS and therefore provide insights into the normal aging process. (C) 2011 Elsevier Inc. All rights reserved.