Two-dimensional mapping of chemical information at atomic resolution
Two-dimensional mapping of chemical information at atomic resolution
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DOI：
10.1103/physrevlett.99.086102
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发表时间：
2007-08-24
影响因子：
8.6
通讯作者：
Allen, L. J.
中科院分区：
文献类型：
--
作者：
Bosman, M.;Keast, V. J.;Allen, L. J.
在原子尺度上同时测量结构和化学信息，为材料科学和纳米技术中的形式和功能之间的联系提供了基本见解。我们证明结构和化学映射在Bi0.5Sr0.5MnO3使用像差校正的扫描透射电子显微镜。二维映射是可能的电子能量损失谱的快速采集适应的方法。实验数据得到了模拟的支持，这有助于解释不太直观的特征。
The simultaneous measurement of structural and chemical information at the atomic scale provides fundamental insights into the connection between form and function in materials science and nanotechnology. We demonstrate structural and chemical mapping in Bi0.5Sr0.5MnO3 using an aberration-corrected scanning transmission electron microscope. Two-dimensional mapping is made possible by an adapted method for fast acquisition of electron energy-loss spectra. The experimental data are supported by simulations, which help to explain the less intuitive features.