Interaction of a $\hbox{CO}_{2}$ Laser Pulse With Tin-Based Plasma for an Extreme Ultraviolet Lithography Source
Interaction of a $\hbox{CO}_{2}$ Laser Pulse With Tin-Based Plasma for an Extreme Ultraviolet Lithography Source
复制标题
$hbox{CO}_{2}$ 激光脉冲与锡基等离子体的相互作用,用于极紫外光刻源
DOI:
10.1109/tps.2009.2034379
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发表时间:
2010
影响因子:
1.5
通讯作者:
F. Najmabadi
中科院分区:
文献类型:
--
作者:
Y. Tao;M. Tillack;S. Yuspeh;R. Burdt;N. Shaikh;N. Amin;F. Najmabadi
The interaction of a CO2 laser pulse with Sn-based plasma for a 13.5-nm extreme ultraviolet (EUV) lithography source was investigated. It was noted that a CO2 laser with wavelength of 10.6 ¿m is more sensitive to surface impurities as compared with a Nd:YAG laser with wavelength of 1.06 ¿m . This reveals that a CO2 laser is more likely absorbed in a thinner layer near the target surface. Compared with a Nd:YAG laser, a CO2 laser shows higher in-band (2% bandwidth) conversion efficiency (CE) with a solid Sn target due to less reabsorption of the EUV emission induced by the plasma. However, with foam targets containing low concentrations of Sn, the in-band CE is lower than that with solid Sn. The CE can be enhanced with plasma confinement. These results suggest that a driving laser with wavelength between 1.06 and 10.6 ¿m may be an even better choice to generate higher CE from laser to 13.5-nm EUV emission.
影响因子:
2.2
作者:
Nishihara, Katsunobu;Sunahara, Atsushi;Mima, Kunoki
通讯作者:
Mima, Kunoki