Step‐climbing Epitaxy of Layered Materials with Giant Out‐of‐plane Lattice Mismatch
Step‐climbing Epitaxy of Layered Materials with Giant Out‐of‐plane Lattice Mismatch
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具有巨大面外晶格失配的层状材料的阶梯攀爬外延
DOI:
10.1002/adma.202202754
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发表时间:
2022-07
期刊:
影响因子:
--
通讯作者:
Hailin Peng
中科院分区:
文献类型:
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作者:
Xuehan Zhou;Yan Liang;Huixia Fu;Ruixue Zhu;Jingyue Wang;Xuzhong Cong;Congwei Tan;Congcong Zhang;Yichi Zhang;Yani Wang;Qijia Xu;Peng Gao;Hailin Peng
Heteroepitaxy with large lattice mismatch remains a great challenge for high-quality epifilm growth. Although great efforts have been devoted to epifilm growth with an in-plane lattice mismatch, the epitaxy of two-dimensional (2D) layered crystals on stepped substrates with a giant out-of-plane lattice mismatch is seldom reported. Here, taking the molecular beam epitaxy of 2D semiconducting Bi2 O2 Se on three-dimensional SrTiO3 substrates as an example, we propose a step-climbing epitaxy growth strategy, in which the nth (n = 1, 2, 3…) epilayer climbs the step with height difference from out-of-plane lattice mismatch and continues to grow the n+1th epilayer. Step-climbing epitaxy can spontaneously relax and release the strain from the out-of-plane lattice mismatch, which ensures the high quality of large-area epitaxial films. Wafer-scale uniform 2D Bi2 O2 Se single-crystal films with controllable thickness can be obtained via step-climbing epitaxy. Most notably, one-unit-cell Bi2 O2 Se films (1.2 nm thick) exhibit a high Hall mobility of 180 cm2 /Vs at room temperature, which exceeds that of silicon and other 2D semiconductors with comparable thickness. As an out-of-plane lattice mismatch is generally present in the epitaxy of layered materials, the step-climbing epitaxy strategy expands the existing epitaxial growth theory and provides guidance toward the high-quality synthesis of layered materials. This article is protected by copyright. All rights reserved.