A Review of Grain Boundary and Heterointerface Characterization in Polycrystalline Oxides by (Scanning) Transmission Electron Microscopy
A Review of Grain Boundary and Heterointerface Characterization in Polycrystalline Oxides by (Scanning) Transmission Electron Microscopy
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DOI：
10.3390/cryst11080878
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发表时间：
2021-07
期刊：
影响因子：
2.7
通讯作者：
H. Vahidi;Komal Syed;Huiming Guo;Xin Wang;Jenna L. Wardini;Jenny Martinez;W. J. Bowman
中科院分区：
文献类型：
--
作者：
H. Vahidi;Komal Syed;Huiming Guo;Xin Wang;Jenna L. Wardini;Jenny Martinez;W. J. Bowman
晶界和异质界面在多晶材料的结构-性能关系中起着至关重要的作用。虽然已经使用了几种方法来表征这样的界面，先进的透射电子显微镜（TEM）和扫描TEM（STEM）技术已被证明是独特的强大工具，使原子结构，电子结构，化学，有序/无序，和点缺陷分布低于原子尺度的量化。本文综述了S/TEM技术在表征多晶氧化物界面方面的最新进展，包括成像、分析光谱（如能量色散X射线谱（EDXS）和电子能量损失谱（EELS））以及扫描衍射方法（如旋进电子纳米衍射（PEND）和4D-STEM）。首先，简要介绍了接口，GB，HI和相关技术。然后，直接关联GB/HI S/TEM表征与多晶氧化物的测量性能的实验研究，以加强我们对这些界面的理解，并展示在S/TEM可用的仪器功能。最后，讨论了现有的挑战和未来的发展机遇。总之，这篇文章是为有兴趣学习和/或使用先进的S/TEM技术来表征多晶材料，特别是陶瓷氧化物中的界面的科学家和工程师准备的指南。
Interfaces such as grain boundaries (GBs) and heterointerfaces (HIs) are known to play a crucial role in structure-property relationships of polycrystalline materials. While several methods have been used to characterize such interfaces, advanced transmission electron microscopy (TEM) and scanning TEM (STEM) techniques have proven to be uniquely powerful tools, enabling quantification of atomic structure, electronic structure, chemistry, order/disorder, and point defect distributions below the atomic scale. This review focuses on recent progress in characterization of polycrystalline oxide interfaces using S/TEM techniques including imaging, analytical spectroscopies such as energy dispersive X-ray spectroscopy (EDXS) and electron energy-loss spectroscopy (EELS) and scanning diffraction methods such as precession electron nano diffraction (PEND) and 4D-STEM. First, a brief introduction to interfaces, GBs, HIs, and relevant techniques is given. Then, experimental studies which directly correlate GB/HI S/TEM characterization with measured properties of polycrystalline oxides are presented to both strengthen our understanding of these interfaces, and to demonstrate the instrumental capabilities available in the S/TEM. Finally, existing challenges and future development opportunities are discussed. In summary, this article is prepared as a guide for scientists and engineers interested in learning about, and/or using advanced S/TEM techniques to characterize interfaces in polycrystalline materials, particularly ceramic oxides.