Probability Models in Engineering and Science
Probability Models in Engineering and Science
复制标题
工程和科学中的概率模型
DOI:
10.1198/tech.2006.s441
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发表时间:
2006
期刊:
影响因子:
2.5
通讯作者:
A. Esmaili
中科院分区:
文献类型:
--
作者:
A. Esmaili
The prerequisites vary in level and depth as topics progress, ranging from probability (sometimes measure-theoretic) and Markov chains to statistical inference (at the level of Bickel and Doksum 1977) and simulation methods. Yet, depending on one’s background and interests, there is some useful material that is accessible to theoreticians and practitioners interested in HMM. There are no exercises at the end of chapters, but the monograph is enriched with a good literature review and complementary material at the end of many chapters. Thus, it is suitable for independent study, and many of the chapters can be easily incorporated into advanced courses on stochastic processes or computational statistics. Even with multiple authors (in addition to those listed, contributors include R. Douc, C. P. Robert, G. Fort, and S. Boucheron), the style is uniform and commendable. Very few typographical errors were noticed in the main text. The flawed index (with mismatched page numbers) has been rectified by the authors (see http://www.tsi.enst.fr/~cappe/ihmm/errata.html). This monograph is a valuable resource. It provides a good literature review, an excellent account of the state of the art research on the necessary theory and algorithms, and ample illustrations of numerous applications of HMM. It goes much beyond the earlier resources on HMMs—the basic introduction to the discrete valued HMM by MacDonald and Zucchini (1997) and the probabilistic account with engineering emphasis by Elliott, Aggoun, and Moore (1995). Theoreticians will benefit from the rigorous development of the theoretical underpinnings, and those with application-oriented interest will like the clear presentations of the algorithms and applications. The HMM methodology is here to stay and will grow more rapidly than ever, and this monograph will serve as a standard reference in that context. The back cover states that “it will be useful for researchers and practitioners in areas such as statistics, signal processing, communications engineering, control theory, econometrics, finance. . . .” This claim is fully justified, and I anticipate this work to serve well many Technometrics readers in the coming years.