A systematic approach toward error structure identification for impedance spectroscopy
A systematic approach toward error structure identification for impedance spectroscopy
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DOI：
10.1016/j.jelechem.2003.11.059
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发表时间：
2004-11-01
影响因子：
4.5
通讯作者：
Orazem, ME
中科院分区：
文献类型：
--
作者：
Orazem, ME
回顾了使用测量模型来评估阻抗测量的随机和偏置误差结构的最新技术。这些方法针对包含电容和电感分量的已发布阻抗数据进行了说明。该系统误差分析表明，尽管顺序阻抗扫描之间存在差异，并且出现了电感和不完整的电容回路，但各个数据集代表了伪稳态系统，并且可以用稳态模型来解释。 (C) 2004 Elsevier B.V. 保留所有权利。
The state-of-the-art is reviewed for the use of measurement models for assessing the stochastic and bias error structure of impedance measurements. The methods are illustrated for published impedance data that contain both capacitive and inductive components. This systematic error analysis demonstrates that, in spite of differences between sequential impedance scans and the appearance of inductive and incomplete capacitive loops, the individual data sets represented a pseudo-stationary system and could be interpreted in terms of a stationary model. (C) 2004 Elsevier B.V. All rights reserved.