Determination of Bit Patterned Media Noise Based on Island Perimeter Fluctuations

Determination of Bit Patterned Media Noise Based on Island Perimeter Fluctuations
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基于岛周长波动的位模式媒体噪声的确定

DOI:
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发表时间:
2012
影响因子:
2.1
通讯作者:
Leon Abelmann
Leon Abelmann
中科院分区:
工程技术4区
文献类型:
--
作者:
L. Alink;J. Groenland;J. D. Vries;Leon Abelmann

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我们测量了用激光干涉光刻法制作的位图形介质中磁岛形状的起伏。这种波动可以准确地描述了一个模型的基础上的傅立叶级数展开的周长的岛屿。该模型可以很容易地链接到幅度和抖动噪声。我们表明,幅度和抖动噪声在原则上是相关的,和抖动噪声增加,增加岛面积。该相关性对于通过激光干涉光刻制备的介质是小的,但预期对于高密度位图案化介质是重要的。
We measured the fluctuation in shape of magnetic islands in bit patterned media fabricated by laser interference lithography. This fluctuation can be accurately described by a model based on a Fourier series expansion of the perimeter of the islands. The model can be easily linked to amplitude and jitter noise. We show that the amplitude and jitter noise are in principle correlated, and the jitter noise increases with increasing island area. The correlation is small for media prepared by laser interference lithography, but expected to gain importance for high density bit patterned media.
了解位模式介质中的错误来源以提高读取通道性能
DOI: 10.1109/tmag.2008.2002516
发表时间: 2008
影响因子: 2.1
作者:
Nutter P
通讯作者: Nutter P