Secondary electron yield of surfaces: what we know and what we still need to know
Secondary electron yield of surfaces: what we know and what we still need to know
复制标题
表面的二次电子产率：我们所知道的和我们仍然需要知道的
DOI：
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发表时间：
2020
期刊：
影响因子：
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通讯作者：
M. Taborelli
中科院分区：
文献类型：
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作者：
M. Taborelli
粒子加速器中的电子云现象与束视线内表面的二次电子产额有关。目前，先进的模型来预测电子云，通过模拟代码是可用的，它们依赖于实验数据或参数化的各种数量和依赖关系描述的电子撞击和发射的表面上的行为。在本贡献中，我们回顾了关于这些依赖关系的已建立的内容以及仍然应该执行的测量。
The electron cloud phenomenon in particle accelerators is related to the secondary electron yield of the surfaces in line of sight of the beam. At present, advanced models to predict electron cloud through simulation codes are available and they rely either on experimental data or on parametrizations of the various quantities and dependencies describing the behaviour of electrons impinging on and emitted from the surface. In the present contribution, we review what is well established about these dependencies and which measurements should still be performed.