An X-ray BBB Michelson interferometer.
An X-ray BBB Michelson interferometer.
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X 射线 BBB 迈克尔逊干涉仪。
DOI：
10.1107/s0909049504015468
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发表时间：
2004
影响因子：
2.5
通讯作者：
M. Yabashi
中科院分区：
文献类型：
--
作者：
J. Sutter;T. Ishikawa;U. Kuetgens;G. Materlik;Y. Nishino;A. Rostomyan;K. Tamasaku;M. Yabashi
在Bonse和Hart的BBB干涉仪的基础上，设计了一种用于波长约为1a的x射线的新型x射线迈克尔逊干涉仪。在这里，在SPring-8 1公里光束线BL29XUL上进行的进一步测试被报道。其中一个BBB的反射镜被一个压电片取代，以引入所需的路径长度差。雪崩光电二极管测量所得的强度随压电电压的变化可以归因于由路径长度变化引起的相位变化，以及相对于晶体其余部分的前镜晶格平面位置变化的一小部分额外贡献。这种“迈克尔逊条纹”的解释是由观察到的稳定运动的输出光束的干涉条纹产生的折射楔当压电电压斜坡。在给定波长下，一条完整条纹所需的前镜位移仅为0.675 A；因此，正如之前的实验所表明的那样，一个安静的环境对操作这个设备至关重要。
A new X-ray Michelson interferometer based on the BBB interferometer of Bonse and Hart and designed for X-rays of wavelength approximately 1 A was described in a previous paper. Here, a further test carried out at the SPring-8 1 km beamline BL29XUL is reported. One of the BBB's mirrors was displaced by a piezo to introduce the required path-length difference. The resulting variation of intensity with piezo voltage as measured by an avalanche photodiode could be ascribed to the phase variation resulting from the path-length change, with a small additional contribution from the change of the position of the lattice planes of the front mirror relative to the rest of the crystal. This 'Michelson fringe' interpretation is supported by the observed steady movement across the output beam of the interference fringes produced by a refractive wedge when the piezo voltage was ramped. The front-mirror displacement required for one complete fringe at the given wavelength is only 0.675 A; therefore, a quiet environment is vital for operating this device, as previous experiments have shown.