Roughness of thin perfluoropolyether lubricant films: influence on disk drive technology
Roughness of thin perfluoropolyether lubricant films: influence on disk drive technology
复制标题
全氟聚醚润滑油薄膜的粗糙度：对磁盘驱动器技术的影响
DOI：
10.1109/20.950978
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发表时间：
2001
影响因子：
2.1
通讯作者：
K. Leach
中科院分区：
文献类型：
--
作者：
C. M. Mate;M. Toney;K. Leach
在磁盘驱动器技术中，润滑剂的厚度和粗糙度是重要的，但往往被忽视，对滑块磁盘间距的贡献。在本文中，我们使用X射线反射率来测量硅晶片和碳涂层上的全氟聚醚润滑剂（Fomblin Zdol）的厚度和润滑剂-空气粗糙度。对于光滑硅上的Zdol，粗糙度随着润滑剂厚度的增加而增加，这与毛细管波粗糙化一致。对于无定形氢化碳的粗糙表面上的Zdol，润滑剂平滑到受毛细管波粗糙化限制的值。我们表明，表面以上的润滑剂密度不达到空气的密度，直到大约3/spl σ/远离平均润滑剂厚度。该润滑剂-空气界面宽度对当前和未来的滑块-盘间距有很大贡献。
In disk drive technology, lubricant thickness and roughness are important, but often overlooked, contributors to slider-disk spacing. In this paper, we use X-ray reflectivity to measure the thickness and lubricant-air roughness of a perfluoropolyether lubricant (Fomblin Zdol) on silicon wafers and carbon overcoats. For Zdol on smooth silicon, the roughness increases with increasing lubricant thickness consistent with capillary wave roughening. For Zdol on the rougher surface of amorphous hydrogenated carbon, the lubricant smoothes to a value limited by the capillary wave roughening. We show that the lubricant density above the surface does not reach the density of air until approximately 3/spl sigma/ away from the average lubricant thickness. This lubricant-air interface width contributes substantially to current and future slider-disk spacings.