Low-noise magnetic force microscopy with high resolution by tip cooling
Low-noise magnetic force microscopy with high resolution by tip cooling
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DOI：
10.1109/tmag.2005.859891
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发表时间：
2005-12
影响因子：
2.1
通讯作者：
H. Saito;R. Sunahara;Y. Rheem;S. Ishio
中科院分区：
文献类型：
--
作者：
H. Saito;R. Sunahara;Y. Rheem;S. Ishio
采用自制的针尖冷却装置，利用常规的高真空磁力显微镜实现了低噪声磁力显微镜（MFM）。在130 K的尖端温度的MFM的噪声水平估计在/spl μ/N/m的顺序。对于记录密度为1000 kfci的高密度记录介质，获得了10 nm的高空间分辨率。通过针尖冷却的分辨率的提高是由于悬臂梁的热力学噪声的降低和由于针尖的磁硬化而有效地减少了针尖-样品距离的结果。
Low-noise magnetic force microscopy (MFM) was realized by using a conventional high-vacuum MFM with homemade tip-cooling equipment. The noise level of the MFM at a tip temperature of 130 K was estimated at /spl mu/N/m order. High spatial resolution of 10 nm was obtained for observing high-density recording media with recording density of 1000 kfci. The improvement of resolution by tip cooling was a result of the reduction of thermodynamic noise of a cantilever and the effective reduction of tip-sample distance due to the magnetic hardening of a tip.