Accurate alignment of a photonic crystal nanocavity with an embedded quantum dot based on optical microscopic photoluminescence imaging

Accurate alignment of a photonic crystal nanocavity with an embedded quantum dot based on optical microscopic photoluminescence imaging
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DOI:
10.1063/1.4773882
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发表时间:
2013-01-07
影响因子:
4
通讯作者:
Noda, S.
Noda, S.
中科院分区:
物理与天体物理2区
文献类型:
--
作者:
Kojima, T.;Kojima, K.;Noda, S.

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我们已经开发出一种技术来对准二维光子晶体纳米腔(PCNC)与砷化铟/砷化镓自组装量子点(QD),使用显微光致发光(μ-PL)光谱成像晶片与低密度的量子点和预先形成的定位标记。从mu-PL光谱评估各个QD发射波长,并确定相对于标记的位置。量子点发射峰与PCNC共振频率之间的波长失调< 4 nm,对准标准偏差< 50 nm。通过该技术对准的单个QD和PCNC的发射峰显示出反交叉,这意味着高精度。(C)2013年美国物理学会。[http://dx.doi.org/10.1063/1.4773882]
We have developed a technique to align a two-dimensional photonic-crystal nanocavity (PCNC) with an indium arsenide/gallium arsenide self-assembled quantum dot (QD), using microscopic photoluminescence (mu-PL) spectroscopy to image a wafer with a low-density of QDs and pre-formed positioning marks. Individual QD emission wavelengths were evaluated from mu-PL spectra, and positions relative to the marks were determined. The wavelength detuning between the QD-emission peak and the PCNC resonant frequency was < 4 nm, and the alignment standard deviation was < 50 nm. The emission peaks of a single QD and a PCNC aligned by this technique showed anti-crossing, implying high accuracy. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4773882]