TEM analysis of high temperature annealed W nanostructure surfaces
TEM analysis of high temperature annealed W nanostructure surfaces
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DOI：
10.1016/j.jnucmat.2011.11.044
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发表时间：
2012-02
影响因子：
3.1
通讯作者：
S. Kajita;N. Yoshida;R. Yoshihara;N. Ohno;T. Yokochi;M. Tokitani;S. Takamura
中科院分区：
文献类型：
--
作者：
S. Kajita;N. Yoshida;R. Yoshihara;N. Ohno;T. Yokochi;M. Tokitani;S. Takamura
在偏滤器模拟器 NAGDIS-II 中使用钨进行氦等离子体辐射和电子加热实验。氦等离子体照射钨导致表面形成纳米结构，而在样品电位变为正值10分钟后纳米结构湮灭，使电子照射样品而不进行离子照射。借助于聚焦离子束技术，通过透射电子显微镜对样本进行了详细分析。研究表明，即使纳米结构从表面消失，氦纳米气泡仍然存在。纳米结构钨的孔隙率是通过 TEM 图像测量的。
Helium plasma irradiation and electron heating experiments were conducted using tungsten in the divertor simulator NAGDIS-II. Helium plasma irradiation to tungsten led to the formation of nanostructures on the surface, while the nanostructures were annihilated after the potential of the specimen was changed to positive for several 10min so that electrons irradiated the sample without ion irradiation. The specimens were analyzed in detail by transmission electron microscope with the help of focused ion beam technique. It is revealed that the helium nano-bubbles still remained even after the nanostructures were disappeared from the surface. Porosity of the nanostructured tungsten was measured from the TEM images.