X-ray mirror metrology using SCOTS/deflectometry
X-ray mirror metrology using SCOTS/deflectometry
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DOI:
10.1117/12.2024500
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发表时间:
2013-09
期刊:
影响因子:
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通讯作者:
R. Huang;P. Su;J. Burge;M. Idir
中科院分区:
文献类型:
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作者:
R. Huang;P. Su;J. Burge;M. Idir
SCOTS is a high precision slope measurement technology based on deflectometry. Light pattern on a LCD display illuminates the test surface and its reflected image is used to calculate the surface slope. SCOTS provides a high dynamic range full field measurement of the optics without null optics required. We report SCOTS tests on X-ray mirrors to nm and even sub nm level with precise calibration of the test system. A LCD screen with dots/check board pattern was aligned into the system at the test mirror position to calibrate camera imaging distortion in-situ. System errors were further eliminated by testing and subtracting a reference flat which was also aligned at the same position as the test mirror. A virtual reference based on the ideal shape of the test surface was calculated and subtracted from the test raw data. This makes the test a ‘virtual null’ test. Two X-ray mirrors were tested with SCOTS. 0.1μrad (rms) slope precision and sub nm (rms) surface accuracy were achieved.