X-ray spectrometry : recent technological advances
X-ray spectrometry : recent technological advances
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DOI:
10.1002/0470020431
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发表时间:
2004-06
期刊:
影响因子:
--
通讯作者:
K. Tsuji;J. Injuk;R. Grieken
中科院分区:
文献类型:
--
作者:
K. Tsuji;J. Injuk;R. Grieken
Contributors.Preface.1 Introduction.1.1 Considering the Role of X-ray Spectrometry in Chemical Analysis and Outlining the Volume.2 X-Ray Sources.2.1 Micro X-ray Sources.2.2 New Synchrotron Radiation Sources.2.3 Laser-driven X-ray Sources.3 X-Ray Optics.3.1 Multilayers for Soft and Hard X-rays.3.2 Single Capillaries X-ray Optics.3.3 Polycapillary X-ray Optics.3.4 Parabolic Compound Refractive X-ray Lenses.4 X-Ray Detectors.4.1 Semiconductor Detectors for (Imaging) X-ray Spectroscopy.4.2 Gas Proportional Scintillation Counters for X-ray Spectrometry.4.3 Superconducting Tunnel Junctions.4.4 Cryogenic Microcalorimeters.4.5 Position Sensitive Semiconductor Strip Detectors.5 Special Configurations.5.1 Grazing-incidence X-ray Spectrometry.5.2 Grazing-exit X-ray Spectrometry.5.3 Portable Equipment for X-ray Fluorescence Analysis.5.4 Synchrotron Radiation for Microscopic X-ray Fluorescence Analysis.5.5 High-energy X-ray Fluorescence.5.6 Low-energy Electron Probe Microanalysis and Scanning Electron Microscopy.5.7 Energy Dispersive X-ray Microanalysis in Scanning and Conventional Transmission Electron Microscopy.5.8 X-Ray Absorption Techniques.6 New Computerisation Methods.6.1 Monte Carlo Simulation for X-ray Fluorescence Spectroscopy.6.2 Spectrum Evaluation.7 New Applications.7.1 X-Ray Fluorescence Analysis in Medical Sciences.7.2 Total Reflection X-ray Fluorescence for Semiconductors and Thin Films.7.3 X-Ray Spectrometry in Archaeometry.7.4 X-Ray Spectrometry in Forensic Research.7.5 Speciation and Surface Analysis of Single Particles Using Electron-excited X-ray Emission Spectrometry.Index.