Detecting pattern-based outliers
Detecting pattern-based outliers
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DOI:
10.1016/s0167-8655(03)00165-x
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发表时间:
2003-12
期刊:
影响因子:
--
通讯作者:
Tianming Hu;S. Sung
中科院分区:
文献类型:
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作者:
Tianming Hu;S. Sung
Outlier detection targets those exceptional data that deviate from the general pattern. Besides high density clustering, there is another pattern called low density regularity. Thus, there are two types of outliers w.r.t. them. We propose two techniques: one to identify the two patterns and the other to detect the corresponding outliers.