An improved apparatus for surface photovoltage studies with a bimorphous piezoelectric Kelvin probe
An improved apparatus for surface photovoltage studies with a bimorphous piezoelectric Kelvin probe
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使用双晶压电开尔文探针进行表面光电压研究的改进装置
DOI：
10.1088/0022-3735/20/3/008
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发表时间：
1987
期刊：
影响因子：
--
通讯作者：
B. Georgiev
中科院分区：
文献类型：
--
作者：
K. Germanova;Ch. M. Hardalov;V. Strashilov;B. Georgiev
本文描述了一种改进的测量半导体表面光电压谱的装置，该装置采用双晶压电驱动器振荡一个凸形开尔文参比电极。达到了0.1 mV的灵敏度。该设备体积小，易于操作，与VSK 4-300莱宝贺利氏光学低温恒温器兼容，可以覆盖从液氦到室温的范围。
An improved apparatus for measuring surface photovoltage spectra of semiconductors is described in which a boss-shaped Kelvin reference electrode is oscillated by using a bimorphic piezoelectric driver. A sensitivity of 0.1 mV is achieved. The apparatus is small in size, easy to handle and is compatible with the VSK 4-300 Leybold Heraeus optical cryostat allowing the range from liquid helium to room temperature to be covered.