Thickness dependent electronic structure of La0.6Sr0.4MnO3 layer in SrTiO3/La0.6Sr0.4MnO3/SrTiO3 heterostructures studied by hard x-ray photoemission spectroscopy
Thickness dependent electronic structure of La0.6Sr0.4MnO3 layer in SrTiO3/La0.6Sr0.4MnO3/SrTiO3 heterostructures studied by hard x-ray photoemission spectroscopy
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DOI：
10.1063/1.3081016
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发表时间：
2009-02
影响因子：
4
通讯作者：
K. Yoshimatsu;K. Horiba;H. Kumigashira;E. Ikenaga;M. Oshima
中科院分区：
文献类型：
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作者：
K. Yoshimatsu;K. Horiba;H. Kumigashira;E. Ikenaga;M. Oshima
利用硬x射线光发射光谱（HX-PES）研究了夹在SrTiO3之间的数字控制La0.6Sr0.4MnO3 （LSMO）层的电子结构随LSMO层厚度的变化。HX-PES谱显示了Mn在费米能级附近的三维衍生态的演化和在8 ML时金属-绝缘体跃迁的发生。对厚度相关的HX-PES谱的详细分析表明，由于通过界面的显著相互作用，在界面区域存在约4 ML的低导电性和非磁性过渡层。
The authors have investigated changes in the electronic structures of digitally controlled La0.6Sr0.4MnO3 (LSMO) layers sandwiched between SrTiO3 as a function of LSMO layer thickness in terms of hard x-ray photoemission spectroscopy (HX-PES). The HX-PES spectra show the evolution of Mn 3d derived states near the Fermi level and the occurrence of metal-insulator transition at 8 ML. The detailed analysis for the thickness dependent HX-PES spectra reveals the existence of the less conducting and nonmagnetic transition layer with a film thickness of about 4 ML in the interface region owing to significant interaction through the interface.