Detection of Latent Infection of Wheat Leaves Caused by Blumeria graminis f.sp tritici Using Nested PCR
Detection of Latent Infection of Wheat Leaves Caused by Blumeria graminis f.sp tritici Using Nested PCR
复制标题
巢式PCR检测小麦叶片由小麦白粉菌专化型(Blumeria graminis f.sp tritici)引起的潜伏感染
DOI:
10.1111/j.1439-0434.2009.01594.x
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发表时间:
2010-04-01
影响因子:
1.5
通讯作者:
Zhou, Yilin
中科院分区:
文献类型:
--
作者:
Zeng, Xiaowei;Luo, Yong;Zhou, Yilin
Wheat powdery mildew caused by Blumeria graminis f.sp. tritici (Bgt) is an important and destructive disease worldwide. Detection of latent infection of wheat seedlings is critical to estimate initial inoculum potential of epidemics in the fields. To improve the conventional method, a nested PCR approach had been established in this study to detect latent infections of wheat leaves caused by Bgt. The DNA primer sets including external and internal primer pairs for the nested PCR were designed followed by testing their specificities to Bgt by using Bgt and other fungal species of wheat. Sensitivity test demonstrated that the nested PCR could detect as low as 0.1 fg template DNA and about 10,000 times more sensitive than the standard PCR. Results of artificial inoculation experiments showed that the nested PCR assay can detect a low level of latent infection of wheat seedlings 2 days earlier than did standard PCR. The incidences of latent infection of wheat seedlings determined by the nested PCR linearly correlated with those by the conventional incubation method (r2 = 0.66, P = 0.0023). The incidences of latent infection detected with nested PCR were higher than that with the conventional method. This study provides an accurate method to efficiently estimate the initial inoculum potential of wheat powdery mildew epidemics in the fields.