Analysis of Element Failures in Active Incoherent Microwave Imaging Arrays Using Noise Signals
Analysis of Element Failures in Active Incoherent Microwave Imaging Arrays Using Noise Signals
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DOI：
10.1109/lmwc.2018.2890246
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发表时间：
2019-02-01
影响因子：
3
通讯作者：
Nanzer, Jeffrey A.
中科院分区：
文献类型：
--
作者：
Vakalis, Stavros;Nanzer, Jeffrey A.
分析了有源非相干微波成像阵列中接收器元件故障的影响。有源非相干微波成像是一种新的成像方法，它利用噪声信号的传输与使用干涉处理的稀疏阵列相结合。在这种方法中，单个接收器阵列元件的故障会导致图像逐渐退化，而不是像素损失。这封信根据随机失效元素形成的图像与所有元素形成的图像相比的均方根误差（RMSE）来分析图像退化。使用 5.85 GHz 实验成像系统测量的数据表明，RMSE 可以保持在 10% 以下，故障率高达 25%。模型化的成像性能和点扩散函数的旁瓣水平与高达 50% 的元件故障的测量数据很好地跟踪，这表明了一种用于预测成像性能的稳健方法。
An analysis of the effects of receiver element failures in active incoherent microwave imaging arrays is presented. Active incoherent microwave imaging is a new imaging method that uses transmission of noise signals combined with a sparse array using interferometric processing. In this method, the failure of individual receiver array elements results in gradual degradation of the image, rather than losses of pixels. This letter analyzes the image degradation in terms of the root-mean-square error (RMSE) of the image formed with randomly failed elements compared to the image formed with all elements. Measured data using a 5.85-GHz experimental imaging system show that RMSE below 10% can be maintained with failure rates extending up to 25%. Modeled image formation performance and the sidelobe level of the point spread function is shown to track well with the measured data for up to 50% element failures, indicating a robust method for predicting imaging performance.