Growth of YBa2Cu3O7 superconductor thin films using ethanolamine-based solutions via simple spin coating

Growth of YBa2Cu3O7 superconductor thin films using ethanolamine-based solutions via simple spin coating
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使用乙醇胺溶液通过简单旋涂生长 YBa2Cu3O7 超导薄膜

DOI:
10.1016/j.rinp.2018.09.020
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发表时间:
2018
期刊:
影响因子:
5.3
通讯作者:
Yasuda Arata
Yasuda Arata
中科院分区:
物理与天体物理2区
文献类型:
--
作者:
Moriya Katsuhiko;Igarashi Kazuki;Watanabe Hazuki;Hasegawa Hayato;Sasaki Tetsuo;Yasuda Arata

文献摘要

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采用简单的旋涂技术,以乙醇胺为溶剂在玻璃基片上沉积存款YBa2Cu3O7(YBCO)薄膜,乙醇胺是一种相对安全、无毒、无氟、廉价的溶剂,用于钇钡铜氧化物(YBCO)超导体的制备过程。在这项研究中,高品质的YBCO薄膜制备通过旋涂不同的沉积凝胶膜退火温度下提出。此外,在至少400 °C的低退火温度下获得YBCO薄膜。X射线衍射分析表明,YBCO薄膜在23°、32°和40°处有不同的衍射峰。此外,我们观察到每个YBCO峰的衍射强度随着退火温度的升高而增加。随着在800 °C下退火时间变长,YBCO取向峰的c轴变强。因此,更高的退火温度被认为是导致了YBCO晶体生长的增强。与此相反,较长的退火时间增强的YBCO晶体的c轴取向的再生长。在YBCO薄膜和衬底横截面的二次电子能谱(SEM)图像中,对于高和低退火温度样品,获得的YBCO薄膜厚度约为3 μm。所获得的YBCO薄膜图像的横截面平坦且清晰。研究表明,退火温度和时间是获得高质量YBCO薄膜晶体的重要因素。此外,我们假设退火温度和时间是获得高度取向的YBCO薄膜晶体的重要参数。
A simple spin coating technique was used to deposit YBa2Cu3O7(YBCO) thin films on glass substrates using an ethanolamine-based solvent, which is a relatively safe, nontoxic, fluorine-free, and inexpensive solvent used in the production process of yttrium barium copper oxide (YBCO) superconductors. In this study, high quality YBCO thin films fabricated via spin coating under varying deposited gel film annealing temperatures are proposed. Moreover, YBCO thin films were obtained at a low annealing temperature of at least 400 °C. The X-ray diffraction analysis spectra of the fabricated YBCO thin films revealed various unique YBCO peaks at 23°, 32°, and 40°, respectively. Additionally, we observed that the diffraction intensity of each YBCO peak increased as the annealing temperature increased. As the annealing time became longer at 800 °C, the c-axis of the YBCO oriented peak became stronger. Consequently, the higher annealing temperature was assumed to have resulted in the enhancement of the YBCO crystal growth. In contrast, a longer annealing time enhanced the re-growth of the YBCO crystal to the c-axis orientation. In secondary electronic spectroscopy (SEM) images of the YBCO thin film and substrate cross sections, the obtained YBCO thin film thickness was approximately 3 µm for both high and low annealing temperature samples. The obtained cross section of the YBCO thin film images was flat and clear. This study established that annealing temperature and time are very important factors for obtaining high quality YBCO thin film crystals. Additionally, we assumed that annealing temperature and time are important parameters for obtaining highly oriented YBCO thin film crystals.