Design for hierarchical two-pattern testability of data paths
Design for hierarchical two-pattern testability of data paths
复制标题
数据路径的分层双模式可测试性设计
DOI：
10.1109/ats.2001.990251
复制
发表时间：
2001
期刊：
影响因子：
--
通讯作者：
H. Fujiwara
中科院分区：
文献类型：
--
作者：
Md. Altaf;S. Ohtake;H. Fujiwara
介绍了延迟故障数据通路的分层可测性概念。提出了一种层次化双模式可测试数据路径的定义。此外，可测性设计（DFT）的方法，提出了增加一个数据路径的HTPT之一。DFT方法结合了HTPT数据路径的基于图的分析，并使用了一些图形算法。所提出的方法可以以更低的硬件开销为代价提供与增强扫描方法类似的优点。
Introduces the concept of hierarchical testability, of data paths for delay faults. A definition of a hierarchically two-pattern testable (HTPT) data path is developed. Also, a design for testability (DFT) method is presented to augment a data path to an HTPT one. The DFT method incorporates a graph-based analysis of an HTPT data path and makes use of some graph algorithms. The proposed method can provide similar advantages to the enhanced scan approach at the cost of much lower hardware overhead.