Improvement in XAFS beamline BL01B1 at SPring-8
Improvement in XAFS beamline BL01B1 at SPring-8
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SPring-8 的 XAFS 光束线 BL01B1 的改进
DOI：
10.1088/1742-6596/190/1/012041
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发表时间：
2009
期刊：
影响因子：
--
通讯作者：
N. Azumi
中科院分区：
文献类型：
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作者：
T. Uruga;H. Tanida;Kazuo Kato;Y. Furukawa;T. Kudo;N. Azumi
光束线BL01B1是1997年在SPring-8使用弯曲磁铁光源为常规XAFS测量构建的。BL01B1采用可调倾斜双晶单色仪和双镜系统，覆盖3.8至113 keV的宽能量范围。在这里，我们介绍了一种新开发的装置和BL01B1的现状。建立了一种高效的QEXAFS方法，可以在最短的时间内测量高k区域的高质量光谱。该方法涉及使用VME步进电机控制器以可变角速度根据k区域连续扫描单色仪。在扫描过程中，单色仪的一对晶体像通道切割晶体一样无平移运动地旋转。该QEXAFS方法应用于荧光模式，采用19元锗探测器结合数字x射线处理器系统。研制了一种具有旋转取样台的单晶样品转换电子产率检测器。样品旋转阶段围绕与样品表面垂直的轴进行4度角振荡，成功地消除了XAFS光谱中的衍射噪声。
Beamline BL01B1 was constructed for conventional XAFS measurements using a bending magnet light source at SPring-8 in 1997 [1]. BL01B1 covers a wide energy range from 3.8 to 113 keV using an adjustable inclined double-crystal monochromator and a double mirror system. Here, we describe a newly developed apparatus and the current status of the BL01B1. A time-efficient QEXAFS method was developed to measure high quality spectra up to high-k regions in the shortest possible time. The method involves sweeping the monochromator continuously at a variable angular speed depending on the k-region using a VME stepping motor controller. During scanning, a pair of crystals of the monochromator rotates without translation motion like a channel-cut crystal. This QEXAFS method was applied to the fluorescence mode using a 19-element Ge detector combined with a digital X-ray processor system. A new conversion electron yield detector having a rotational sample stage was developed for single crystalline samples. Angular oscillations of 4 degrees in the sample rotation stage around the axis normal to the sample surface successfully remove diffraction noise in the XAFS spectra.