Near-field nanoprobing using Si tip-Au nanoparticle photoinduced force microscopy with 120:1 signal-to-noise ratio, sub-6-nm resolution
Near-field nanoprobing using Si tip-Au nanoparticle photoinduced force microscopy with 120:1 signal-to-noise ratio, sub-6-nm resolution
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DOI：
10.1364/oe.26.026365
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发表时间：
2018-10-01
期刊：
影响因子：
3.8
通讯作者：
Wickramasinghe, H. Kumar
中科院分区：
文献类型：
--
作者：
Rajaei, Mohsen;Almajhadi, Mohammad Ali;Wickramasinghe, H. Kumar
我们建议在光感应力显微镜(PiFM)中使用硅针尖-Au纳米粒子(NP)组合系统来从根本上提高其在光-物质相互作用的纳米尺度表征中的精度。与传统的Au涂层PIFM相比，这种Si针尖和Au Np的组合能够在克服Au涂层针尖诱导的各向异性的同时，实现更好的光诱导力检测。我们绘制了不同排列的Au纳米粒子的近场分布，获得了120的信噪比和低于6 nm的分辨率，甚至超过了尖端曲率限制；我们还绘制了具有良好对称性的方位偏振光束轮廓。所提出的方法对于有前景的单分子光谱学来说是必不可少的。(C)2018年OSA开放获取出版协议条款下的美国光学学会
We propose using a Si tip-Au nanoparticle (NP) combination system in photoinduced force microscopy (PiFM) to fundamentally improve its accuracy in the nanoscale characterization of light-matter interaction. Compared to conventional PiFM with Au-coated tips, such Si tip and Au NP combination enables superior photo-induced force detection while overcoming the tip-induced anisotropy by Au-coating. We map the near-field distribution of Au NPs in different arrangements achieving 120 signal-to-noise ratio and sub-6-nm resolution, even surpassing the tip-curvature limitation; we also map the azimuthally polarized beam profile showing an excellent symmetry. The proposed approach is essential to the promising single molecule spectroscopy. (C) 2018 Optical Society of America under the terms of the OSA Open Access Publishing Agreement