Effect of substrate temperature on magnetic properties of strontium ferrite thin films
Effect of substrate temperature on magnetic properties of strontium ferrite thin films
复制标题
衬底温度对锶铁氧体薄膜磁性能的影响
DOI：
10.1109/20.617857
复制
发表时间：
1997
影响因子：
2.1
通讯作者：
T. Yamazaki
中科院分区：
文献类型：
--
作者：
A. Morisako;M. Matsumoto;S. Takei;T. Yamazaki
采用直流磁控溅射法制备了锶六角铁氧体薄膜，并对其晶体结构和磁性能进行了研究。发现SrM膜的晶化温度为500/s/l deg/C左右。在550/spl ° C的衬底温度（Ts）下观察到c轴的优先取向。在550/spl deg/C的Ts下制备的薄膜在垂直方向上表现出3.5kOe的最大极化率。
Strontium hexagonal ferrite (SrM) thin films were prepared by a dc magnetron sputtering system, and the crystal structure and magnetic properties were studied. It was found that crystallization temperature of SrM film was around 500/spl deg/C. Preferential orientation of c-axis was observed at the substrate temperature (Ts) of 550/spl deg/C. The films prepared at Ts of 550/spl deg/C exhibited the maximum coercivity of 3.5 kOe in the perpendicular direction.