EVALUATION OF THE SPATIAL-RESOLUTION OF A CT SCANNER BY DIRECT ANALYSIS OF THE EDGE RESPONSE FUNCTION
EVALUATION OF THE SPATIAL-RESOLUTION OF A CT SCANNER BY DIRECT ANALYSIS OF THE EDGE RESPONSE FUNCTION
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DOI：
10.1118/1.595328
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发表时间：
1983-01-01
期刊：
影响因子：
3.8
通讯作者：
BENTZEN, SM
中科院分区：
文献类型：
--
作者：
BENTZEN, SM
提出了一种测量计算机断层扫描（CT）系统空间分辨率的新方法。该方法是基于一个直接的最小二乘拟合的分析表达式从2种材料之间的界面的CT图像获得的一组数据。结合G.E.介绍了RTTRAN计算机配置。该方法被应用在确定的EMI-7070扫描仪的分辨率，它示出了整个CT图像的系统分辨率的均匀性的假设是满足本方法的精度内。该方法的重现性估计从一系列的空间分辨率测定进行的10个图像与相同的扫描参数。该系列的SD为3.2%。
A new approach to the measurement of the spatial resolution of a computed tomography (CT) scanner system is presented. The method is based on a direct least-squares fit of an analytical expression to a set of data obtained from a CT image of the interface between 2 materials. The implementation of the method in connection with the G.E. RTPLAN computer configuration is described. The method was applied in determining the resolution of an EMI-7070 scanner and it is shown that the assumption of uniformity of the system resolution across the CT image is fulfilled within the accuracy of the present method. The reproducibility of the method was estimated from a series of spatial resolution determinations performed on 10 images taken with identical scan parameters. The SD of this series was 3.2%.