Proton radiation damage experiment on P-Channel CCD for an X-ray CCD camera onboard the ASTRO-H satellite
Proton radiation damage experiment on P-Channel CCD for an X-ray CCD camera onboard the ASTRO-H satellite
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DOI：
10.1016/j.nima.2013.05.052
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发表时间：
2013-06
影响因子：
1.4
通讯作者：
K. Mori;Y. Nishioka;Satoshi Ohura;Yoshiaki Koura;M. Yamauchi;H. Nakajima;S. Ueda;Hiroaki Kan;N. Anabuki;Ryo Nagino;K. Hayashida;H. Tsunemi;T. Kohmura;S. Ikeda;H. Murakami;M. Ozaki;T. Dotani;Y. Maeda;K. Sagara
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文献类型：
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作者：
K. Mori;Y. Nishioka;Satoshi Ohura;Yoshiaki Koura;M. Yamauchi;H. Nakajima;S. Ueda;Hiroaki Kan;N. Anabuki;Ryo Nagino;K. Hayashida;H. Tsunemi;T. Kohmura;S. Ikeda;H. Murakami;M. Ozaki;T. Dotani;Y. Maeda;K. Sagara
报道了ASTRO-H卫星x射线CCD相机新研制的p通道CCD的质子辐射损伤实验。该装置以6.7 MeV的速度暴露在109个质子cm−2下。电荷转移效率（CTI）随辐射剂量的变化而变化。通过与朱雀卫星上CCD相机6年来测得的测辐射量进行比较，证实了新型p通道CCD具有足够的耐辐射能力，可以在太空中使用。我们还证实，电荷注入技术和降低工作温度有效地降低了我们设备的CTI。并与其它p通道CCD实验进行了比较。
We report on a proton radiation damage experiment on P-channel CCD newly developed for an X-ray CCD camera onboard the ASTRO-H satellite. The device was exposed up to 109protons cm−2at 6.7 MeV. The charge transfer inefficiency (CTI) was measured as a function of radiation dose. In comparison with the CTI currently measured in the CCD camera onboard the Suzaku satellite for 6 years, we confirmed that the new type of P-channel CCD is radiation tolerant enough for space use. We also confirmed that a charge-injection technique and lowering the operating temperature efficiently work to reduce the CTI for our device. A comparison with other P-channel CCD experiments is also discussed.