On efficient X-handling using a selective compaction scheme to achieve high test response compaction ratios
On efficient X-handling using a selective compaction scheme to achieve high test response compaction ratios
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使用选择性压实方案进行高效 X 处理以实现高测试响应压实比
DOI：
10.1109/icvd.2005.127
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发表时间：
2005
期刊：
影响因子：
--
通讯作者：
I. Pomeranz
中科院分区：
文献类型：
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作者：
Huaxing Tang;Chen Wang;J. Rajski;S. Reddy;J. Tyszer;I. Pomeranz
我们提出了一种增强的选择性压缩方案，该方案集成了选择性填充测试、选择性链掩蔽和选择性链观测三种技术，以减少未知值对测试响应压实率的影响。在几个工业设计上的实验结果表明，该方案在不影响测试质量的情况下实现了很高的测试响应紧实率。
We propose an enhanced selective compaction scheme, which integrates three techniques, called selectively filled tests, selective chains masking and selective chains observation, to reduce the impact of unknown values on the test response compaction ratio. Experimental results on several industrial designs demonstrate the effectiveness of the proposed scheme in achieving a very high test response compaction ratio without compromising the test quality.