Efficient seed utilization for reseeding based compression [logic testing]
Efficient seed utilization for reseeding based compression [logic testing]
复制标题
基于重新播种的压缩的高效种子利用[逻辑测试]
DOI:
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发表时间:
2003
期刊:
影响因子:
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通讯作者:
Subhasish Mitra
中科院分区:
文献类型:
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作者:
E. Volkerink;Subhasish Mitra
The conventional LFSR reseeding technique for test data compression generates one test pattern from each LFSR seed. The seed size is determined by the maximum number of specified bits in a test pattern belonging to a given test set. However, for most practical designs the majority of test patterns have significantly fewer specified bits compared to the maximum. This limits the amount of compression that can be achieved with conventional reseeding. This paper presents a new reseeding technique that overcomes this problem by generating a single test pattern from multiple seeds and multiple test patterns from a single seed. The new reseeding technique is applied to two industrial designs, resulting in significant reduction in tester memory requirement and test application time compared to the conventional reseeding technique.