Electrostatics of individual single-walled carbon nanotubes investigated by electrostatic force microscopy.

Electrostatics of individual single-walled carbon nanotubes investigated by electrostatic force microscopy.
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DOI:
10.1103/physrevlett.94.186801
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发表时间:
2005-05
影响因子:
8.6
通讯作者:
M. Paillet;P. Poncharal;A. Zahab
M. Paillet;P. Poncharal;A. Zahab
中科院分区:
物理与天体物理1区
文献类型:
--
作者:
M. Paillet;P. Poncharal;A. Zahab

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我们报道了在Si+115 nm SiO2衬底上生长的单个单壁碳纳米管的静电荷分布的实验研究。通过这些实验,我们得出电荷沿纳米管均匀分布的结论。我们证明了静电力显微镜可以准确地测量每单位长度的电荷量。我们发现这个数量与直径有关,在-3.5 V电位下,2.5 nm纳米管每纳米有1个电子。
We report an experimental study of static charge distribution in individual single-walled carbon nanotubes grown on a Si+115 nm SiO2 substrate. From these experiments, we conclude that charges are distributed uniformly along the nanotubes. We demonstrate that electrostatic force microscopy can accurately measure the amount of charges per unit length. We found that this amount is diameter dependent and in the range of 1 electron per nanometer for a 2.5 nm nanotube at a potential of -3.5 V.