STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun
STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun
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DOI：
10.1093/jmicro/dfp030
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发表时间：
2009-12-01
期刊：
影响因子：
--
通讯作者：
Takayanagi, Kunio
中科院分区：
文献类型：
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作者：
Sawada, Hidetaka;Tanishiro, Yasumasa;Takayanagi, Kunio
最近研制了一种球差校正的电子显微镜，它配备了300千伏的冷场发射枪和一个色差系数较小的物镜。在高角环形暗场(HAADF)扫描透射式电子显微镜(STEM)中，用0.4 eV的电子束能量扩展分辨出间隔为47 pm的哑铃图像，该哑铃图像对应于沿[114]方向排列的一对Ge原子柱。将观测图像与动力学计算得到的模拟图像进行了比较。
A spherical aberration-corrected electron microscope has been developed recently, which is equipped with a 300-kV cold field emission gun and an objective lens of a small chromatic aberration coefficient. A dumbbell image of 47 pm spacing, corresponding to a pair of atomic columns of germanium aligned along the [114] direction, is resolved in high-angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) with a 0.4-eV energy spread of the electron beam. The observed image was compared with a simulated image obtained by dynamical calculation.