3-DIMENSIONAL X-RAY MICROTOMOGRAPHY
3-DIMENSIONAL X-RAY MICROTOMOGRAPHY
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DOI：
10.1126/science.237.4821.1439
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发表时间：
1987-09-18
期刊：
影响因子：
56.9
通讯作者：
DAMICO, KL
中科院分区：
文献类型：
--
作者：
FLANNERY, BP;DECKMAN, HW;DAMICO, KL
新的X射线显微层析成像技术非破坏性地生成小样品内部X射线衰减系数的三维图，精度约为1%，分辨率接近1微米。空间分辨的元素图可以用同步加速器X射线源通过在刚好高于和低于特征原子吸收边缘的能量下扫描样品来产生。该系统由一个高分辨率的成像X射线探测器和高速算法的断层图像重建。的设计和操作的显微断层摄影设备进行了描述，并提出了断层图像，说明其性能与同步加速器和实验室的X射线源。
The new technique of x-ray microtomography nondestructively generates three-dimensional maps of the x-ray attenuation coefficient inside small samples with approximately 1 percent accuracy and with resolution approaching 1 micrometer. Spatially resolved elemental maps can be produced with synchrotron x-ray sources by scanning samples at energies just above and below characteristic atomic absorption edges. The system consists of a high-resolution imaging x-ray detector and high-speed algorithms for tomographic image reconstruction. The design and operation of the microtomography device are described, and tomographic images that illustrate its performance with both synchrotron and laboratory x-ray sources are presented.