Scaling of diffraction intensities near the origin: some rigorous results
Scaling of diffraction intensities near the origin: some rigorous results
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DOI：
10.1088/1742-5468/ab02f2
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发表时间：
2019-05
期刊：
影响因子：
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通讯作者：
M. Baake;U. Grimm
中科院分区：
文献类型：
--
作者：
M. Baake;U. Grimm
的标度行为的衍射强度附近的原点的研究（部分）有序系统，强调说明性的，严格的结果。这是一个既定的方法来检测和量化的波动行为下已知的术语超均匀性。在这里，我们考虑一维系统的纯点，奇异连续和绝对连续的衍射谱，其中包括完美有序的切割和投影和暴胀点集以及系统的随机无序。
The scaling behaviour of the diffraction intensity near the origin is investigated for (partially) ordered systems, with an emphasis on illustrative, rigorous results. This is an established method to detect and quantify the fluctuation behaviour known under the term hyperuniformity. Here, we consider one-dimensional systems with pure point, singular continuous and absolutely continuous diffraction spectra, which include perfectly ordered cut and project and inflation point sets as well as systems with stochastic disorder.