Patterned Magnetic Permalloy and Nickel Films: Fabrication by Electron Beam and X-Ray Lithographic Techniques
Patterned Magnetic Permalloy and Nickel Films: Fabrication by Electron Beam and X-Ray Lithographic Techniques
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图案化磁性坡莫合金和镍薄膜:通过电子束和 X 射线光刻技术制造
DOI:
10.1143/jjap.41.5149
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发表时间:
2002
影响因子:
1.5
通讯作者:
G. Carlotti
中科院分区:
文献类型:
--
作者:
P. Candeloro;A. Gerardino;E. Fabrizio;S. Cabrini;G. Giannini;Luigi Mastrogiacomo;M. Ciria;R. O'handley;G. Gubbiotti;G. Carlotti
Electron beam (e-beam) and X-ray lithographic techniques have been used to fabricate permalloy (Ni80Fe20) and nickel rectangular and triangular dots and antidots on an area of (1×1) mm2. Dot dimensions and spacings range from 500 nm to 1 µm and from 250 nm to 50 nm, respectively. The changes of the magnetic properties induced by patterning have been studied by means of magneto-optic Kerr effect (MOKE) magnetometry and the Brillouin light scattering (BLS) technique.