Relaxation processes of photo-excited carriers on the atomically-controlled semiconductor surfaces studied by time-resolved soft x-ray photoelectron spectroscopy
Relaxation processes of photo-excited carriers on the atomically-controlled semiconductor surfaces studied by time-resolved soft x-ray photoelectron spectroscopy
复制标题
时间分辨软X射线光电子能谱研究原子控制半导体表面光激发载流子的弛豫过程
DOI：
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发表时间：
2014
期刊：
影响因子：
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通讯作者：
I. Matsuda,
中科院分区：
文献类型：
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作者：
S. Yamamoto;M. Ogawa;K. Fujikawa;R. Hobara;R. Yukawa;Sh. Yamamoto;S. Kitagawa;D. Pierucci;M.G. Silly;C.-H. Lin;R.-Y. Liu;H. Daimon;F. Sirotti;S.-J. Tang;I. Matsuda,
