Structure analysis of a buried interface between organic and porous inorganic layers using spin-contrast-variation neutron reflectivity

Structure analysis of a buried interface between organic and porous inorganic layers using spin-contrast-variation neutron reflectivity
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DOI:
10.1107/s1600576722007506
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发表时间:
2022-10-01
影响因子:
6.1
通讯作者:
Niizeki, Tomotake
Niizeki, Tomotake
中科院分区:
材料科学3区
文献类型:
--
作者:
Kumada, Takayuki;Miura, Daisuke;Niizeki, Tomotake

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这项工作表明的优势,自旋衬度变化中子反射率(NR)的结构分析的埋在双层膜中的界面,包括有机和无机层的丙烯酸聚氨酯树脂和甲基化的二氧化硅(MePDS),来自甲基取代的全氢聚硅氮烷。当质子极化P-H从0变化到+/-24%时,双层膜的NR曲线发生显著变化。这些NR曲线未使用标准双层模型的全局拟合再现。NR曲线在P-H = -24%处的振荡从使用P-H = 0%处的曲线的最佳拟合结构参数的拟合曲线略微且不可忽略地偏移。从振荡的偏移发现,MePDS层的密度在界面的几纳米内降低,但是树脂不渗透低密度MePDS层。
This work demonstrates the advantage of spin-contrast-variation neutron reflectivity (NR) for the structure analysis of a buried interface in a bilayer film comprising organic and inorganic layers of acrylic urethane resin and methylated silica (MePDS), derived from methyl-group-substituted perhydropolysilazane. As the proton polarization P-H changed from 0 to +/- 24%, the NR curve of the bilayer film varied significantly. These NR curves were not reproduced using global fitting with a standard bilayer model. The oscillation in the NR curve at P-H = -24% was shifted slightly and non-negligibly from the fitting curve using the best-fit structure parameters for the curve at P-H = 0%. It was found from the shift of the oscillation that the density of the MePDS layer decreased within several nanometres of the interface, but the resin did not permeate the low-density MePDS layer.