Comparison of heavy ion and proton-induced single event effects (SEE) sensitivities
Comparison of heavy ion and proton-induced single event effects (SEE) sensitivities
复制标题
DOI：
10.1109/tns.2002.805426
复制
发表时间：
2002-12
影响因子：
1.8
通讯作者：
R. Koga;P. Yu;K. Crawford;S. Crain;V. Tran
中科院分区：
文献类型：
--
作者：
R. Koga;P. Yu;K. Crawford;S. Crain;V. Tran
比较了一组微电路的质子感生单粒子效应和重离子感生效应。尽管一些微电路对重离子表现出相对较高的敏感性，但它们对质子并没有相应的敏感性。
Proton-induced single event effects of a set of microcircuits are compared with effects due to heavy ions. Even though some microcircuits show a relatively high sensitivity to heavy ions, they do not have a corresponding sensitivity to protons.