The identification of soft X-ray lines

The identification of soft X-ray lines
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DOI:
10.1016/s0584-8547(02)00274-4
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发表时间:
2003-04-18
影响因子:
3.3
通讯作者:
Wendt, M
Wendt, M
中科院分区:
化学2区
文献类型:
--
作者:
Assmann, A;Wendt, M

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对于软X射线,在100 ≤ hv ≤ 700eV范围内,给出了与E.W.白色和G. G.比约翰逊高出两个数量级。这些新数据可能有助于正确识别软X射线谱线。最后,一些选定的情况下,主线之间的严重重叠进行了讨论。(C)2002 Elsevier Science B.V.保留所有权利。
For soft X-rays, in the range 100 less than or equal to hv less than or equal to 700 eV, new data of the relative intensities of L and M lines are presented which differ from those given in the popular tables prepared by E.W. White and G.G. Johnson by up to two orders of magnitude. The new data may be helpful in identifying soft X-ray lines correctly. Finally, some selected cases of severe overlaps between principal lines are discussed. (C) 2002 Elsevier Science B.V. All rights reserved.