Element-selective imaging of atomic columns in a crystal using STEM and EELS
Element-selective imaging of atomic columns in a crystal using STEM and EELS
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DOI：
10.1038/nature06352
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发表时间：
2007-11-29
期刊：
影响因子：
64.8
通讯作者：
Ishizuka, Kazuo
中科院分区：
文献类型：
--
作者：
Kimoto, Koji;Asaka, Toru;Ishizuka, Kazuo
微结构表征已成为研究复杂材料(如强关联氧化物)不可或缺的一部分，并可获得有关其物理性质来源的有用信息。虽然原子分辨测量早已成为可能，但微结构表征的一个重要目标是实现原子分辨率的元素选择成像。扫描电子显微镜(STEM)和电子能量损失谱(EELS)(1，2)相结合是一种很有前途的原子柱分析技术。然而，由于一些困难，例如非弹性散射的离域或仪器的不稳定性，二维分析还没有进行。在这里，我们演示了使用定域非弹性散射和稳定扫描透射电子显微镜的晶体样品的原子柱成像(3)。层状锰氧化物La1.2Sr1.8Mn2O7中的La、Mn和O原子柱被可视化为二维图像。
Microstructure characterization has become indispensable to the study of complex materials, such as strongly correlated oxides, and can obtain useful information about the origin of their physical properties. Although atomically resolved measurements have long been possible, an important goal in microstructure characterization is to achieve element-selective imaging at atomic resolution. A combination of scanning transmission electron microscopy (STEM) and electron energy-loss spectroscopy (EELS)(1,2) is a promising technique for atomic-column analysis. However, two-dimensional analysis has not yet been performed owing to several difficulties, such as delocalization in inelastic scattering or instrumentation instabilities. Here we demonstrate atomic-column imaging of a crystal specimen using localized inelastic scattering and a stabilized scanning transmission electron microscope(3). The atomic columns of La, Mn and O in the layered manganite La1.2Sr1.8Mn2O7 are visualized as two-dimensional images.