Photomodulated infrared spectroscopy by a step-scan Fourier transform infrared spectrometer
Photomodulated infrared spectroscopy by a step-scan Fourier transform infrared spectrometer
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DOI：
10.1063/1.2378675
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发表时间：
2006-11
影响因子：
4
通讯作者：
J. Shao;F. Yue;Xiang Lu;W. Lu;Wei Huang;Zhifeng Li;Shaoling Guo;J. Chu
中科院分区：
文献类型：
--
作者：
J. Shao;F. Yue;Xiang Lu;W. Lu;Wei Huang;Zhifeng Li;Shaoling Guo;J. Chu
基于步进扫描傅里叶变换红外光谱仪，开发了一种长波长光调制光谱技术。讨论了实验装置，并给出了窄禁带HgCdTe材料在5 μ m和9μm波长下的光反射谱。光致发光光谱表明，PR功能相关的材料基本的差距。PR光谱的信噪比和光谱分辨率对于线形分析是相当好的。结果表明，三阶导数线形函数能很好地拟合光致变色光谱。强调了其优点和可扩展性，并展望了推进窄禁带材料能带结构研究的潜力。
A technique is developed for photomodulated spectroscopy in a long-wavelength region, based on a step-scan Fourier transform infrared spectrometer. The experimental setup is discussed, and photoreflectance (PR) spectra of narrow-gap HgCdTe materials are given as examples at the wavelengths of 5 and 9μm. The photoluminescence spectra suggest that the PR features are related to the material fundamental gap. The signal-to-noise ratio and spectral resolution of the PR spectrum are quite good for line-shape analysis. The results indicate that the PR spectrum can be well fitted by a third-derivative line-shape function. Advantages and extendability are emphasized, and the potential for advancing the study of narrow-gap materials’ band structures is foreseen.