Recent progress of resistive switching random access memory (RRAM)

Recent progress of resistive switching random access memory (RRAM)
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阻变随机存取存储器(RRAM)的最新进展

DOI:
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发表时间:
2012
期刊:
IEEE Silicon Nanoelectronics Workshop
影响因子:
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通讯作者:
H. Wong
H. Wong
中科院分区:
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文献类型:
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作者:
Yi Wu;Shimeng Yu;X. Guan;H. Wong

文献摘要

被引文献

相似文献

本文综述了金属氧化物阻性开关存储器(RRAM)的最新研究成果。研究了金属氧化物RRAM中电阻开关的随机性,建立了二维解析解来解释HfOx基RRAM中开关参数的变化。作为超越数字存储器/存储的应用的一个例子,基于ALOX的RRAM被探索用于神经形态计算。
This paper gives an overview of recent works on metal oxide resistive switching memory (RRAM). We explored the stochastic nature of resistive switching in metal oxide RRAM and a 2-D analytical solver was established to explain the switching parameter variations in HfOx-based RRAM. As an example of application beyond digital memory/storage, AlOx-based RRAM was explored for neuromorphic computing.