Molecular resolution of thin, highly oriented poly (tetrafluoroethylene) films with the atomic force microscope
Molecular resolution of thin, highly oriented poly (tetrafluoroethylene) films with the atomic force microscope
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使用原子力显微镜对薄的、高度取向的聚（四氟乙烯）薄膜进行分子分辨率
DOI：
10.1016/0032-3861(92)90745-i
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发表时间：
1992
期刊：
影响因子：
4.6
通讯作者：
J. C. Wittman
中科院分区：
文献类型：
--
作者：
H. Hansma;F. Motamedi;Paul S. Smith;P. Hansma;J. C. Wittman
用简单的机械沉积技术生产薄的高度取向的聚（PTFE）（PTFE，Teflon®）层。以前，它表明，这些薄膜是非常有效的基板的各种材料的定向生长。在这篇文章中，我们报告了PTFE层的结构，正如原子力显微镜（AFM）所揭示的那样，分辨率足以区分单个大分子。AFM图像显示了从几纳米到40 μm的扫描尺寸的表面粗糙度。对受损膜的分析允许估计膜厚度，其范围为15 - 40 nm厚。
Thin, highly oriented layers of poly(tetrafluoroethylene) (PTFE, Teflon®) were produced with a simple mechanical deposition technique. Previously, it was shown that these films are exceptionally efficient substrates for oriented growth of a variety of materials. In this communication we report on the structure of the PTFE layers, as revealed with the atomic force microscope (AFM), at a resolution sufficient to distinguish the individual macromolecules. AFM images showed the surface roughness from scan sizes of a few nanometres up to 40 μm. Analysis of damaged films allowed an estimation of the film thickness, which ranges from ∼15 to 40 nm thick.