Model-building strategies for low-resolution X-ray crystallographic data
Model-building strategies for low-resolution X-ray crystallographic data
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DOI：
10.1107/s0907444908040006
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发表时间：
2009-02-01
影响因子：
2.2
通讯作者：
Furnham, Nicholas
中科院分区：
文献类型：
--
作者：
Karmali, Anjum M.;Blundell, Tom L.;Furnham, Nicholas
低分辨率X射线晶体学数据的解释被证明是具有挑战性的，即使是最有经验的晶体学家。电子密度图的模糊性使得主链追踪和侧链分配变得困难。然而，在低于3.5埃的分辨率下解决的结构的数量正在迅速增长，并且这些结构通常具有很高的生物学意义和重要性。在这里，所面临的挑战，在电子密度的解释，已被用来克服他们和发展自动化的过程中的策略进行审查。采用的方法在模型生成的电子显微镜，其中有许多相同的挑战，在提供高置信度的大分子结构和组件的模型，也被认为是。
The interpretation of low-resolution X-ray crystallographic data proves to be challenging even for the most experienced crystallographer. Ambiguity in the electron-density map makes main-chain tracing and side-chain assignment difficult. However, the number of structures solved at resolutions poorer than 3.5 angstrom is growing rapidly and the structures are often of high biological interest and importance. Here, the challenges faced in electron-density interpretation, the strategies that have been employed to overcome them and developments to automate the process are reviewed. The methods employed in model generation from electron microscopy, which share many of the same challenges in providing high-confidence models of macromolecular structures and assemblies, are also considered.